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American Institute of Physics, Journal of Vacuum Science and Technology A, 6(39), p. 060802, 2021

DOI: 10.1116/6.0001289

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High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy

Journal article published in 2021 by Julien E. Rault ORCID, Cheng-Tai Kuo ORCID, Henrique P. Martins ORCID, Giuseppina Conti, Slavomír Nemšák ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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