Published in
American Institute of Physics, Applied Physics Letters, 11(117), p. 113701, 2020
DOI: 10.1063/5.0024863
Links
Tools
The effect of finite sample thickness in scanning ion conductance microscopy stiffness measurements
Journal article published in 2020 by
Johannes Rheinlaender 
,
Tilman E. Schäffer
,
Tilman E. Schäffer
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 