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American Association for the Advancement of Science, Science Advances, 37(6), 2020

DOI: 10.1126/sciadv.abb8431

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Aberration-corrected STEM imaging of 2D materials: Artifacts and practical applications of threefold astigmatism

Journal article published in 2020 by Sergei Lopatin ORCID, Areej Aljarb ORCID, Vladimir Roddatis ORCID, Tobias Meyer ORCID, Yi Wan, Jui-Han Fu, Mohamed Hedhili ORCID, Yimo Han ORCID, Lain-Jong Li ORCID, Vincent Tung ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Phase off: false phase emerges in scanning transmission electron microscopy (STEM) imaging of 2D Materials.