Published in
Wiley, Journal of Microscopy, 3(280), p. 252-269, 2020
DOI: 10.1111/jmi.12938
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Quantitative phase‐mode electrostatic force microscopy on silicon oxide nanostructures
Journal article published in 2020 by
C. Albonetti 
,
S. Chiodini ,
P. Annibale,
P. Stoliar,
R. V. Martinez,
R. Garcia,
F. Biscarini
,
S. Chiodini ,
P. Annibale,
P. Stoliar,
R. V. Martinez,
R. Garcia,
F. Biscarini
This paper is made freely available by the publisher.
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