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American Institute of Physics, AIP Conference Proceedings, 2016

DOI: 10.1063/1.4961138

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Early science commissioning results of the sub-micron resolution X-ray spectroscopy beamline (SRX) in the field of materials science and engineering

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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